发明名称 |
METHODS, DEVICES AND KITS FOR PERI-CRITICAL REFLECTANCE SPECTROSCOPY |
摘要 |
Spectroscopy apparatuses oriented to the critical angle of the sample are described that detecting the spectral characteristics of a sample wherein the apparatus consists of an electromagnetic radiation source adapted to excite a sample with electromagnetic radiation introduced to the sample at an angle of incidence at or near a critical angle of the sample; a transmitting crystal in communication with the electromagnetic radiation source and the sample, the transmitting crystal having a high refractive index adapted to reflect the electromagnetic radiation internally; a reflector adapted to introduce the electromagnetic radiation to the sample at or near an angle of incidence near the critical angle between the transmitting crystal and sample; and a detector for detecting the electromagnetic radiation from the sample. Also, provided herein are methods, systems, and kits incorporating the peri-critical reflectance spectroscopy apparatus. |
申请公布号 |
WO2009137122(A9) |
申请公布日期 |
2010.02.11 |
申请号 |
WO2009US32706 |
申请日期 |
2009.01.30 |
申请人 |
RARE LIGHT, INC.;MESSERSCHMIDT, ROBERT, G. |
发明人 |
MESSERSCHMIDT, ROBERT, G. |
分类号 |
G01N21/25;G01N21/43;G01N21/62 |
主分类号 |
G01N21/25 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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