发明名称 STRUCTURE AND METHOD OF LATCHUP ROBUSTNESS WITH PLACEMENT OF THROUGH WAFER VIA WITHIN CMOS CIRCUITRY
摘要 A method of manufacturing a semiconductor structure includes: forming a trench in a back side of a substrate; depositing a dopant on surfaces of the trench; forming a shallow trench isolation (STI) structure in a top side of the substrate opposite the trench; forming a deep well in the substrate; out-diffusing the dopant into the deep well and the substrate; forming an N-well and a P-well in the substrate; and filling the trench with a conductive material.
申请公布号 US2010032767(A1) 申请公布日期 2010.02.11
申请号 US20080186802 申请日期 2008.08.06
申请人 CHAPMAN PHILLIP F;COLLINS DAVID S;VOLDMAN STEVEN H 发明人 CHAPMAN PHILLIP F.;COLLINS DAVID S.;VOLDMAN STEVEN H.
分类号 H01L21/762;H01L27/092 主分类号 H01L21/762
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