发明名称 METHOD FOR PATTERNING MATERIAL LAYER
摘要 The invention is directed to a method for patterning a material layer. The method comprises steps of providing a material layer. The material layer has a first hard mask layer and a second hard mask layer successively formed thereon. Then, the second hard mask layer is patterned to form a plurality of openings therein. A patterned photoresist layer is formed to cover the second hard mask layer and the patterned photoresist layer exposes a portion of the openings. The first hard mask layer with the patterned photoresist layer and the patterned second hard mask layer together as a mask. Then, the patterned photoresist layer and the patterned second hard mask layer are removed. The material layer is patterned with the patterned first hard mask layer as a mask.
申请公布号 US2010035191(A1) 申请公布日期 2010.02.11
申请号 US20080265997 申请日期 2008.11.06
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 HUANG CHIH-HAO;WU TZONG-HSIEN;YANG CHIN-CHENG;YANG TIEN-CHU
分类号 G03F7/20 主分类号 G03F7/20
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