发明名称 Method for manufacturing semiconductor device
摘要 A method for manufacturing a semiconductor device includes forming a first interlayer insulating film over a semiconductor substrate; forming a first opening in the first interlayer insulating film; forming a second interlayer insulating film on the first interlayer insulating film such that the first opening is not filled; and forming a second opening in the second interlayer insulating film such that the second opening is connected to the first opening.
申请公布号 US2010035402(A1) 申请公布日期 2010.02.11
申请号 US20090461313 申请日期 2009.08.07
申请人 ELPIDA MEMORY, INC. 发明人 HIROTA TOSHIYUKI
分类号 H01L21/02;H01L21/768 主分类号 H01L21/02
代理机构 代理人
主权项
地址