发明名称 Method and apparatus of high speed property mapping
摘要 A probe instrument having a probe that interacts with a sample surface to perform a mechanical property measurement at high speed includes a scanner producing relative motion between the sample and the probe. In addition, a probe actuator produces relative motion between the sample and the probe, in a generally vertical direction, and a controller that generates a scanner drive signal and an actuator drive signal. The probe actuator is responsive to the actuator drive signal and has an operable bandwidth of at least about 50-80 kHz to perform the fast force curve measurements. The probe actuator is preferably located at least partially on the cantilever. Moreover, feedback during normal operation may be interrupted to perform a force curve measurement with the integrated actuator.
申请公布号 US7658097(B2) 申请公布日期 2010.02.09
申请号 US20060537535 申请日期 2006.09.29
申请人 VEECO INSTRUMENTS INC. 发明人 SU CHANMIN;LOMBROZO PETER M.
分类号 G01B5/28 主分类号 G01B5/28
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