发明名称 APPARATUS AND METHOD FOR DETECTING A POSITION
摘要 PURPOSE: An apparatus and a method for detecting a position are provided to a time required for the location of a test socket by sensing the position of the test socket based on the position of a corner of an uppers part. CONSTITUTION: A test socket(40) inspects at least semiconductor module(10). The position of the test socket is detected based on the position of the edge of detected top side. A first detector(200) is faced with the top side of the reference block. The first detector detects the position of the edge having a certain distance from the test socket of the top side. The first detector includes a reflection-type photosensor(210) and a transport unit(220) opposite to the top side of the reference block.
申请公布号 KR20100012991(A) 申请公布日期 2010.02.09
申请号 KR20080074456 申请日期 2008.07.30
申请人 SECRON CO., LTD. 发明人 KIM, JAE SOO;JUNG, YEON HYUK
分类号 H01L21/66 主分类号 H01L21/66
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