发明名称 |
APPARATUS AND METHOD FOR DETECTING A POSITION |
摘要 |
PURPOSE: An apparatus and a method for detecting a position are provided to a time required for the location of a test socket by sensing the position of the test socket based on the position of a corner of an uppers part. CONSTITUTION: A test socket(40) inspects at least semiconductor module(10). The position of the test socket is detected based on the position of the edge of detected top side. A first detector(200) is faced with the top side of the reference block. The first detector detects the position of the edge having a certain distance from the test socket of the top side. The first detector includes a reflection-type photosensor(210) and a transport unit(220) opposite to the top side of the reference block.
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申请公布号 |
KR20100012991(A) |
申请公布日期 |
2010.02.09 |
申请号 |
KR20080074456 |
申请日期 |
2008.07.30 |
申请人 |
SECRON CO., LTD. |
发明人 |
KIM, JAE SOO;JUNG, YEON HYUK |
分类号 |
H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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