发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to minimize the surface detachment between an insulating layer and a tungsten film and to improve seam of the tungsten film. CONSTITUTION: An insulating layer(120) comprises trench on a semiconductor substrate. A metal wiring(160) is formed in the trench into a laminating structure of a CVD tungsten film(150) formed on a PVD tungsten film and a PVD tungsten film(140) formed according to the sidewall and bottom surface of the trench. The insulating layer has compression stress higher than tensile stress of the CVD tungsten film.
申请公布号 KR20100012207(A) 申请公布日期 2010.02.08
申请号 KR20080073472 申请日期 2008.07.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JUNG GEUN;MYUNG, SEONG HWAN;KIM, EUN SOO;KIM, SUK JOONG
分类号 H01L21/28 主分类号 H01L21/28
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