发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to minimize the surface detachment between an insulating layer and a tungsten film and to improve seam of the tungsten film. CONSTITUTION: An insulating layer(120) comprises trench on a semiconductor substrate. A metal wiring(160) is formed in the trench into a laminating structure of a CVD tungsten film(150) formed on a PVD tungsten film and a PVD tungsten film(140) formed according to the sidewall and bottom surface of the trench. The insulating layer has compression stress higher than tensile stress of the CVD tungsten film.
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申请公布号 |
KR20100012207(A) |
申请公布日期 |
2010.02.08 |
申请号 |
KR20080073472 |
申请日期 |
2008.07.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, JUNG GEUN;MYUNG, SEONG HWAN;KIM, EUN SOO;KIM, SUK JOONG |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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