| 摘要 |
PROBLEM TO BE SOLVED: To provide a substrate inspection jig with a simple structure and a contact for use in the substrate inspection jig. SOLUTION: The substrate inspection jig includes: a contact holder 3 holding a plurality of bar-shaped contacts 2 having electric conductivity and having one ends pressed against inspection points; and an electrode 4 which includes an electrode part 41 disposed opposite the other end of each contact 2 and is connected to a substrate inspection device. The contact 2 includes an electrically conductive long bar-shaped member 21 and an electrically conductive coil spring 22 electrically connected to the other end, contracted and stretched in the axial length direction so as to be extended. The contact holder 3 includes a guide hole 311 guiding the one end of the bar-shaped member 21 to the inspection point and a receiving hole 351 guiding an end at the other end of the coil spring 22 of the contact 2 to the electrode part 41. The pitch of the guide hole 311 is smaller than that of the receiving hole 351. COPYRIGHT: (C)2010,JPO&INPIT |
