发明名称 Memory device and wear leveling method
摘要 The memory device selects any one of a first memory cell and a second memory cell based on a number of times that the first memory cell is erased, an elapsed time after the first memory cell is erased, a number of times that the second memory cell is erased, and an elapsed time after the second memory cell is erased, and program data in the selected memory cell. The memory device may improve distribution of threshold voltage of memory cells and endurance of the memory cells.
申请公布号 US2010027335(A1) 申请公布日期 2010.02.04
申请号 US20090379273 申请日期 2009.02.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM YONG JUNE;KIM JAE HONG;CHO KYOUNG LAE;KONG JUN JIN
分类号 G11C16/04;G11C16/06 主分类号 G11C16/04
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