发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE PRODUCTION SYSTEM
摘要 A semiconductor device production system using a laser crystallization method is provided which can avoid forming grain boundaries in a channel formation region of a TFT, thereby preventing grain boundaries from lowering the mobility of the TFT greatly, from lowering ON current, and from increasing OFF current. Rectangular or stripe pattern depression and projection portions are formed on an insulating film. A semiconductor film is formed on the insulating film. The semiconductor film is irradiated with continuous wave laser light by running the laser light along the stripe pattern depression and projection portions of the insulating film or along the major or minor axis direction of the rectangle. Although continuous wave laser light is most preferred among laser light, it is also possible to use pulse oscillation laser light in irradiating the semiconductor film.
申请公布号 US2010029068(A1) 申请公布日期 2010.02.04
申请号 US20090533401 申请日期 2009.07.31
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 ISOBE ATSUO;YAMAZAKI SHUNPEI;DAIRIKI KOJI;SHIBATA HIROSHI;KOKUBO CHIHO;ARAO TATSUYA;HAYAKAWA MASAHIKO;MIYAIRI HIDEKAZU;SHIMOMURA AKIHISA;TANAKA KOICHIRO;AKIBA MAI
分类号 H01L21/311;H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786 主分类号 H01L21/311
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