| 摘要 |
PROBLEM TO BE SOLVED: To provide a faulty flip-flop specification method capable of specifying faulty flip-flop candidates not more than two without increasing the number of pins and wiring regions in a faulty flip-flop specification circuit of a scan chain. SOLUTION: The faulty flip-flop specification circuit 100 of a scan chain which includes: a scan input pin 02 for inputting scan signals; a reset input pin 04 for inputting reset signals; a clock pin for inputting clocks; and a plurality of flip flops and a scan output pin 06, inputs a reset signal from the reset input pin 04 connected to respective reset terminals of all flip flops, inputs an inverted output signal to the scan input terminal of a flip flop at the next stage connected from respective QN terminal of flip flops corresponding to the input of clock signals, and outputs a scan signal to the scan output pin 06 connected to a QN terminal 58 of the flip flop in the final stage. COPYRIGHT: (C)2010,JPO&INPIT
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