发明名称 Method for manufacturing semiconductor device, and substrate processing apparatus
摘要 A method for manufacturing a semiconductor device includes the steps of: loading a substrate into a reaction chamber; supplying reactive gases into the reaction chamber and processing the substrate; and unloading the processed substrate from the reaction chamber, wherein the step of processing the substrate includes: a first film formation step of setting the substrate to a first temperature and forming a first silicon film including impurity atoms on the substrate and a second film formation step of setting the substrate to a second temperature, which is lower than the first temperature, and forming a second silicon film that includes no impurity atoms or has an impurity concentration lower than that of the first silicon film on at least the first silicon film.
申请公布号 US2010029089(A1) 申请公布日期 2010.02.04
申请号 US20090458903 申请日期 2009.07.27
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 MAEDA TAKAHIRO;OWADA NOBUO
分类号 H01L21/30 主分类号 H01L21/30
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