发明名称 |
COPPER ALLOY MATERIAL FOR ELECTRICAL AND ELECTRONIC COMPONENTS, AND MANUFACTURING METHOD THEREFOR |
摘要 |
<p>Disclosed is a copper alloy material for electrical and electronic components that has a composition comprising 0.5-2.0 mass% Co, 0.1-0.5 mass% Si, and the remainder Cu and unavoidable impurities. The crystal grain diameter of the base material copper alloy is 3-35 mm, the particle diameter of a precipitate composed of Co and Si is 5-50 nm, and the density of the precipitate is 1×108 to 1×1010 particles/mm2. The tensile strength of the copper alloy material is at least 550 MPa, and the conductivity is at least 50% IACS.</p> |
申请公布号 |
WO2010013790(A1) |
申请公布日期 |
2010.02.04 |
申请号 |
WO2009JP63616 |
申请日期 |
2009.07.30 |
申请人 |
THE FURUKAWA ELECTRIC CO., LTD.;MIHARA, KUNITERU;MATSUO, RYOSUKE;EGUCHI, TATSUHIKO |
发明人 |
MIHARA, KUNITERU;MATSUO, RYOSUKE;EGUCHI, TATSUHIKO |
分类号 |
C22C9/06;C22C9/00;C22C9/02;C22C9/04;C22C9/05;C22C9/10;C22F1/00;C22F1/08;H01B1/02;H01B13/00 |
主分类号 |
C22C9/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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