发明名称 DATA MEASUREMENT METHODS AND SYSTEMS
摘要 Methods and systems are described for measuring data in a test setup including an impedance tuner. In an exemplary embodiment, the data is data for measuring noise parameters. The data is measured versus a sweep parameter for one tuner state at a time.
申请公布号 WO2010014627(A2) 申请公布日期 2010.02.04
申请号 WO2009US51985 申请日期 2009.07.28
申请人 MAURY MICROWAVE, INC.;SIMPSON, GARY, R. 发明人 SIMPSON, GARY, R.
分类号 主分类号
代理机构 代理人
主权项
地址