发明名称 |
DATA MEASUREMENT METHODS AND SYSTEMS |
摘要 |
Methods and systems are described for measuring data in a test setup including an impedance tuner. In an exemplary embodiment, the data is data for measuring noise parameters. The data is measured versus a sweep parameter for one tuner state at a time. |
申请公布号 |
WO2010014627(A2) |
申请公布日期 |
2010.02.04 |
申请号 |
WO2009US51985 |
申请日期 |
2009.07.28 |
申请人 |
MAURY MICROWAVE, INC.;SIMPSON, GARY, R. |
发明人 |
SIMPSON, GARY, R. |
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