| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor storage device which suppresses increase in the area of a circuit used in a test mode. <P>SOLUTION: The device includes: a processing information setting circuit which sets processing information including a condition of voltage to be applied to a memory element, relating to respective processing operations including rewriting operation and reading operation of a stored content; a writing state machine which controls the processing operations on the basis of an external command and processing information; and one or more function circuits provided with storage circuits to be used for internal processing. In the function circuits, externally utilizable areas set in part or all of the storage areas in the storage circuits can be utilized from the outside of the circuits. The writing state machine stores, during a test mode, processing information for the test mode in the externally utilizable areas in the storage circuits in the function circuits. When carrying out the processing operations in the test mode, the writing state machine controls the operation conditions of the rewriting operation and reading operation on the basis of the processing information for the test mode stored in the storage circuits in the function circuits. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
