SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR TESTING SAME

摘要

A semiconductor memory device includes data input/output terminals (DQ0 to DQ31), a memory cell array 122, and a data latch circuit 111 for temporarily latching data captured from the data input/output terminals and writing the data in the memory cell array with a delay in a normal write operation. The device also includes a test mode in which the data latch circuit latches data read to the data input/output terminals in a read operation and writes previously latched data in the memory cell array without newly latching data from the data input/output terminals in a write operation.