发明名称 Enhanced On-Chip Inductance Structure Utilizing Silicon Through Via Technology
摘要 This invention utilizes silicon through via technology, to build a Toroid into the chip with the addition of a layer of magnetic material such as Nickel above and below the T-coil stacked multi-ring structure. This allows the connection between the inner via and an array of outer vias. This material is added on a BEOL metal layer or as an external coating on the finished silicon. Depending on the configuration and material used for the via, the inductance will increase approximately two orders of magnitude (e.g., by utilizing a nickel via core). Moreover, a ferrite material with proper thermal conduction properties is used in one embodiment.
申请公布号 US2010024202(A1) 申请公布日期 2010.02.04
申请号 US20080184450 申请日期 2008.08.01
申请人 MAKI ANDREW BENSON;BARTLEY GERALD KEITH;GERMANN PHILIP RAYMOND;MAXSON MARK OWEN;BECKER DARRYL JOHN;DAHLEN PAUL ERIC;SHEETS II JOHN EDWARD 发明人 MAKI ANDREW BENSON;BARTLEY GERALD KEITH;GERMANN PHILIP RAYMOND;MAXSON MARK OWEN;BECKER DARRYL JOHN;DAHLEN PAUL ERIC;SHEETS, II JOHN EDWARD
分类号 H01F7/06 主分类号 H01F7/06
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