发明名称 INVERTED VARIABLE RESISTANCE MEMORY CELL AND METHOD OF MAKING THE SAME
摘要 <p>An inverted variable resistance memory cell and a method of fabricating the same. The memory cell is fabricated by forming an opening in an insulating layer deposited over a semiconductor substrate, etching the top portion of the opening to have a substantially hemispherical-shape, forming a metal layer in the opening, and overlying a variable resistance material over the metal layer.</p>
申请公布号 KR20100011973(A) 申请公布日期 2010.02.03
申请号 KR20097025540 申请日期 2008.04.11
申请人 MICRON TECHNOLOGY, INC. 发明人 STANTON WILLIAM
分类号 H01L27/24;G11C16/12;H01L45/00 主分类号 H01L27/24
代理机构 代理人
主权项
地址