| 摘要 |
PURPOSE: A plate for probe card test having pattern is provided to simultenously test contact resistance with electrical open or short without error. CONSTITUTION: A plate for prove card test comprises: plural second plate terminal(22) which contacts with a second kind of probe needle of the prove card in one to one; plural first kind plate terminal which contacts with a first kind of probe needle of the probe card; and plural conductive lines which electrically connects the first kind plate terminal to the second kind plate terminal. |
