发明名称 |
ELECTRON BEAM DRAWING DEVICE, ELECTRON BEAM DRAWING METHOD, METHOD OF MANUFACTURING DISK, AND METHOD OF MANUFACTURING INFORMATION RECORDING MEDIUM |
摘要 |
PROBLEM TO BE SOLVED: To continuously draw a pattern at a high accuracy along a plurality of circumference tracks. SOLUTION: After pattern drawing is started along a circumference track CTr<SB>1</SB>from a drawing starting position SP<SB>1</SB>on the circumference track CTr<SB>1</SB>, an electron beam is deflected to the X axis at a position at which a substrate is rotated by 2π-Δθte<SB>1</SB>. Thus, the incidence position of the electron beam is positioned on the circumference track CTr<SB>2</SB>. Then, after pattern drawing is started along a circumference track CTr<SB>2</SB>from a drawing starting position SP<SB>2</SB>on the circumference track CTr<SB>2</SB>, an electron beam is deflected to the X axis at a position at which the substrate is rotated by 2π+Δθte<SB>1</SB>+Δθte<SB>2</SB>((4π+Δθte<SB>2</SB>)-(2π-Δθte<SB>1</SB>)). Thus, the incidence position of the electron beam is positioned on the circumference track CTr<SB>3</SB>. COPYRIGHT: (C)2010,JPO&INPIT
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申请公布号 |
JP2010026464(A) |
申请公布日期 |
2010.02.04 |
申请号 |
JP20080191275 |
申请日期 |
2008.07.24 |
申请人 |
RICOH CO LTD |
发明人 |
KAMATA TERUMI;WATABE TOSHIO;FUJIWARA YASUHIDE |
分类号 |
G03F7/20;G11B5/84;G11B5/855;G11B7/26;H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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