发明名称 ELECTRON BEAM DRAWING DEVICE, ELECTRON BEAM DRAWING METHOD, METHOD OF MANUFACTURING DISK, AND METHOD OF MANUFACTURING INFORMATION RECORDING MEDIUM
摘要 PROBLEM TO BE SOLVED: To continuously draw a pattern at a high accuracy along a plurality of circumference tracks. SOLUTION: After pattern drawing is started along a circumference track CTr<SB>1</SB>from a drawing starting position SP<SB>1</SB>on the circumference track CTr<SB>1</SB>, an electron beam is deflected to the X axis at a position at which a substrate is rotated by 2&pi;-&Delta;&theta;te<SB>1</SB>. Thus, the incidence position of the electron beam is positioned on the circumference track CTr<SB>2</SB>. Then, after pattern drawing is started along a circumference track CTr<SB>2</SB>from a drawing starting position SP<SB>2</SB>on the circumference track CTr<SB>2</SB>, an electron beam is deflected to the X axis at a position at which the substrate is rotated by 2&pi;+&Delta;&theta;te<SB>1</SB>+&Delta;&theta;te<SB>2</SB>((4&pi;+&Delta;&theta;te<SB>2</SB>)-(2&pi;-&Delta;&theta;te<SB>1</SB>)). Thus, the incidence position of the electron beam is positioned on the circumference track CTr<SB>3</SB>. COPYRIGHT: (C)2010,JPO&amp;INPIT
申请公布号 JP2010026464(A) 申请公布日期 2010.02.04
申请号 JP20080191275 申请日期 2008.07.24
申请人 RICOH CO LTD 发明人 KAMATA TERUMI;WATABE TOSHIO;FUJIWARA YASUHIDE
分类号 G03F7/20;G11B5/84;G11B5/855;G11B7/26;H01L21/027 主分类号 G03F7/20
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