| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method for testing the nonvolatile semiconductor memory device, which can determine pass/fail of a function assigned to a redundant column area. <P>SOLUTION: The method for testing the nonvolatile semiconductor memory device includes a step of writing down a protection flag limiting the operations to a block on a predetermined page within the target block, a step of reading the data on the page containing the protect flag to transfer it to the data register, a step of masking the data in the column address areas except the protect flag in the data transferred to the data register, a step of detecting the defective bits en bloc in the data register, and a step of registering as a defective block when defective bits are detected in the data register. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
