发明名称 Spherical aberration corrected electrostatic lens, input lens, electron spectrometer, photoemission electron microscope and measuring system
摘要 A mesh (M) having an ellipsoid shape or a shape close to the ellipsoid shape is attached to an electrode (EL1) among electrodes (EL1 to ELn). Voltages of the later-stage electrodes (EL2 to ELn) are appropriately set. With this arrangement, a local negative spherical aberration generated by the mesh (M) is cancelled out with a positive spherical aberration. This optimizes an electric field distribution. As a result, this realizes an electrostatic lens whose acceptance angle is extended to about ±60°.
申请公布号 US7655923(B2) 申请公布日期 2010.02.02
申请号 US20040631296 申请日期 2004.11.09
申请人 NATIONAL UNIVERSITY CORPORATION NARA INSTITUTE OFSCIENCE AND TECHNOLOGY;JEOL, LTD. 发明人 DAIMON HIROSHI;MATSUDA HIROYUKI;KATO MAKOTO;KUDO MASATO
分类号 G21K1/08;H01J3/14;H01J3/26;H01J49/42 主分类号 G21K1/08
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