发明名称 Etching method, program, computer readable storage medium and plasma processing apparatus
摘要 A difference in etching rate between the coated silicon based insulating film and any of other kinds of silicon-based insulating films is reduced by using nitrogen gas as a part of the etching gas. Therefore, the underlying film may not be exposed to the etching gas for a long time, so that degradation or deterioration of the underlying film can be prevented.
申请公布号 US7655570(B2) 申请公布日期 2010.02.02
申请号 US20060330336 申请日期 2006.01.12
申请人 TOKYO ELECTRON LIMITED 发明人 KIKUCHI AKIHIRO;SAKAMOTO YUICHIRO;TSUNODA TAKASHI
分类号 H01L21/302;H01L21/461 主分类号 H01L21/302
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