发明名称 Overheat detection in thermally controlled devices
摘要 Systems and methods of overheat detection provide for generating a control signal on a die containing a processor based on an internal temperature of the processor and a control temperature threshold. It can be determined whether to generate a warning temperature event on the die based on a behavior of the control signal. In one embodiment, the warning temperature event provides for initiation of an automated data saving process, which reduces the abruptness of conventional warning temperature shutdowns. Other embodiments provide the user the option of saving his or her work before a shutdown temperature threshold is reached.
申请公布号 US7656635(B2) 申请公布日期 2010.02.02
申请号 US20040912977 申请日期 2004.08.06
申请人 INTEL CORPORATION 发明人 ROTEM EFRAIM
分类号 H02H5/04;G01K1/08 主分类号 H02H5/04
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