发明名称 SENSITIVITY OF ITERATIVE SPECTRALLY SMOOTH TEMPERATURE/EMISSIVITY SEPARATION TO INSTRUMENT NOISE
摘要 A method for estimating the error statistic for retrieved temperature and emissivity of a surface material includes determining the second order analytical error propagation from a measured radiance that differs from the true radiance by additive gaussian noise, which is independent in each band. The radiance error is translated into a diagonal covariance matrix and an analytical estimate results in a determination of the standard deviation and bias of surface temperature. Further, the method for estimating the error statistic utilizes Monte Carlo simulation from a sufficiently large ensemble of radiance spectra for the retrieved surface temperature and emissivity. Temperature and emissivity of the surface material were retrieved using ISST ES algorithm.
申请公布号 CA2416266(C) 申请公布日期 2010.02.02
申请号 CA20012416266 申请日期 2001.07.27
申请人 RAYTHEON COMPANY 发明人 MUSE, ARCHIE, H.;INGRAM, PAUL M., JR.
分类号 G01J5/00;G01J5/60 主分类号 G01J5/00
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