发明名称 |
SENSITIVITY OF ITERATIVE SPECTRALLY SMOOTH TEMPERATURE/EMISSIVITY SEPARATION TO INSTRUMENT NOISE |
摘要 |
A method for estimating the error statistic for retrieved temperature and emissivity of a surface material includes determining the second order analytical error propagation from a measured radiance that differs from the true radiance by additive gaussian noise, which is independent in each band. The radiance error is translated into a diagonal covariance matrix and an analytical estimate results in a determination of the standard deviation and bias of surface temperature. Further, the method for estimating the error statistic utilizes Monte Carlo simulation from a sufficiently large ensemble of radiance spectra for the retrieved surface temperature and emissivity. Temperature and emissivity of the surface material were retrieved using ISST ES algorithm.
|
申请公布号 |
CA2416266(C) |
申请公布日期 |
2010.02.02 |
申请号 |
CA20012416266 |
申请日期 |
2001.07.27 |
申请人 |
RAYTHEON COMPANY |
发明人 |
MUSE, ARCHIE, H.;INGRAM, PAUL M., JR. |
分类号 |
G01J5/00;G01J5/60 |
主分类号 |
G01J5/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|