发明名称 POLISHING APPARATUS OF SUBSTRATE END FACE AND POLISHING DETERMINING METHOD
摘要 <p>To provide a substrate end face polishing apparatus in accordance with an adaptive control incorporating a depth of an abrasion groove of a polishing wheel into a compensation element and having high reliability, together with a method of determining whether the polishing of the substrate is good or bad, the substrate end face polishing apparatus is provided with a polishing wheel for polishing an end face of the substrate, a rotational driving means of the polishing wheel, and a cutting edge feeding means of the polishing wheel, and the rotational driving means of the polishing wheel has a load current detecting means on the basis of end face contact of the substrate, and a compensating means of a load current generated by contact of groove side faces of an abrasion groove formed in the polishing wheel with the substrate.</p>
申请公布号 SG158041(A1) 申请公布日期 2010.01.29
申请号 SG20090041443 申请日期 2009.06.17
申请人 NAKAMURA-TOME PRECISION INDUSTRY CO., LTD.;AVANSTRATE INC. 发明人 TATSUDA KATSUHIKO;YAMAGISHI SOUSHI;IKAI OSAMU;MATSUOKA YUTAKA;ISE HIRONORI
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