发明名称 TEST SOCKET FOR MEMORY MODULE TESTER
摘要 PURPOSE: A test socket for a memory module tester is provided to make the structure a memory module mounting tester by removing a component of a jig socket, a base frame, and a memory connection socket. CONSTITUTION: A socket portion(32) is mounted in a main board. A detachable slider(36S) is inserted into a guide groove(36). A lever supporting unit(42) fixes the separating lever(38) at a hinge pin(40). A guideline gap(44) is formed in the inner side of the guide groove so that the insertion and separation of the memory module is easy. The guide portion(34) is protruded at the both side of the socket.
申请公布号 KR100938599(B1) 申请公布日期 2010.01.26
申请号 KR20090069291 申请日期 2009.07.29
申请人 UNISET CO., LTD. 发明人 KIM, HYUK RYUN;KIM, TAE YEONG
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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