发明名称 Semiconductor memory device
摘要 When data "1" is stored in a memory cell, a bit line is driven to an H level (control line drive potential) and the other bit line is driven to an L level (reference potential) when a sense operation is completed. When a verify write operation is initiated, a charge line is driven from an H level (power supply potential) to an L level (reference potential). By the GIDL current from a source line, accumulation of holes is initiated again for a storage node subsequent to discharge of holes, whereby the potential of the storage node rises towards an H level (period alpha). When the charge line is driven to an H level from an L level, the potential of the storage node further rises (period beta).
申请公布号 US7652927(B2) 申请公布日期 2010.01.26
申请号 US20070797804 申请日期 2007.05.08
申请人 RENESAS TECHNOLOGY CORP. 发明人 MORISHITA FUKASHI;ARIMOTO KAZUTAMI
分类号 G11C16/06 主分类号 G11C16/06
代理机构 代理人
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