| 摘要 |
PURPOSE: An RFID device is provided to restore vulnerable chips into the normal state by screening fail chips initially. CONSTITUTION: An analog block(200) is driven by the burn in voltage. A digital block(300) is driven by the burn in voltage. A FeRAM(ferroelectric RAM)(400) is driven in the activation of the burn-in mode signal with the burn in voltage. The burn-in test device supplies the burn in voltage to the analog block in the activation of the burn-in mode signal, and the digital block and FeRAM. The burn-in test device is formed outside the RFID chip. |
