| 摘要 |
Identifying an optimized test bit pattern for analyzing electrical communications channel topologies, including: ranking according to channel quality, from worst to best, a set of channel topologies for an electrical communications channel; and for each ranked channel topology beginning with the worst, carrying out the following steps in an iterative loop until a concatenated test bit pattern and a previously optimized test bit pattern are functionally equally fit: concatenating to a previously optimized test bit pattern an additional test bit pattern; optimizing the concatenated test bit pattern values for a next ranked channel in the subset, leaving the optimized values of the previously optimized test bit pattern unchanged; and comparing through use of a fitness function the relative qualities of the previously optimized test bit pattern and the optimized concatenated test bit pattern.
|
