发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 A method for fabricating a semiconductor device, comprising: forming n-channel field-effect transistors on a silicon substrate; forming a first insulating film covering the field-effect transistors; shrinking the first insulating film; forming a second insulating film over the first insulating film; and shrinking the second insulating film, wherein the forming an insulating film covering the field-effect transistors and the shrinking the insulating film are repeated a plurality of time.
申请公布号 US2010012991(A1) 申请公布日期 2010.01.21
申请号 US20090567972 申请日期 2009.09.28
申请人 FUJITSU MICROELECTRONICS LIMITED 发明人 OWADA TAMOTSU;WATATANI HIROFUMI
分类号 H01L29/78;H01L21/31 主分类号 H01L29/78
代理机构 代理人
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