| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor testing apparatus, capable of debugging a test program of a DSP (digital signal processor), any times as needed, by using a virtual environment. Ž<P>SOLUTION: In this semiconductor testing apparatus constituted so as to perform operation processing of measurement data of a DUT by the DSP, a measuring file storage means for collecting and storing the measurement data of the DUT is provided in the DSP, and debugging of the DSP is carried out, based on the measurement data stored in the measuring file storage means. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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