发明名称 PHASE-CHANGE MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
摘要 A phase-change memory device in which a phase-change material layer has a multilayered structure with different compositions and a method of fabricating the same are provided. The phase-change memory device includes a first electrode layer formed on a substrate, a heater electrode layer formed on the first electrode layer, an insulating layer formed on the heater electrode layer and having a pore partially exposing the heater electrode layer, a phase-change material layer formed to fill the pore and partially contacting the heater electrode layer, and a second electrode layer formed on the phase-change material layer. The main operating region functioning as a memory operating region is formed of a Ge2Sb2+xTe5 phase-change material to ensure the stability of a memory operation, and simultaneously, the subsidiary regions formed of a Ge2Sb2Te5 phase-change material are disposed respectively on and under the Ge2Sb2+xTe5 main operating region to prevent leakage of thermal energy through an electrode, thereby reducing power consumption.
申请公布号 US2010012915(A1) 申请公布日期 2010.01.21
申请号 US20090425152 申请日期 2009.04.16
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 YOON SUNG MIN;YU BYOUNG GON;JUNG SOON WON;LEE SEUNG YUN;PARK YOUNG SAM;LEE JOON SUK
分类号 H01L47/00;H01L21/06 主分类号 H01L47/00
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