发明名称 TEST HEAD MOVING DEVICE AND ELECTRONIC PART TESTING DEVICE
摘要 <p>A test head moving device (10) comprises a lifting arm (15) for lifting a test head (100), a frame (11) for horizontally moving the test head (100), and an interlock mechanism (20) for prohibiting the horizontal movement of the frame (11) depending on the height of the test head (100). The interlock mechanism (20) includes a limit switch (23) for detecting that the test head (100) is located at the lowermost position and a stopper (30) capable of contacting a pressing unit (50) with a floor surface.</p>
申请公布号 WO2010007652(A1) 申请公布日期 2010.01.21
申请号 WO2008JP62670 申请日期 2008.07.14
申请人 ADVANTEST CORPORATION;YANO, TAKAYUKI 发明人 YANO, TAKAYUKI
分类号 G01R31/26 主分类号 G01R31/26
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