| 摘要 |
Provided is a test apparatus that tests a device under test, including a first pipeline that sequentially propagates pieces of pattern data included in a first test pattern, according to a first test period, and outputs the resulting data to the device under test; a second pipeline that sequentially propagates pieces of pattern data included in a second test pattern, according to a second test period that is different from the first test period, and outputs the resulting data to the device under test; a timing control section that controls at least one of a timing at which the first pipeline begins propagating a predetermined first pattern data and a timing at which the second pipeline begins propagating a predetermined second pattern data, based on the first test period and the second test period; and a judging section that judges pass/fail of the device under test based on a signal output by the device under test. |
