发明名称 ELECTRON GUN, ELECTRON MICROSCOPE, AND ELECTRON GENERATION METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an electron gun capable of aiming at higher quality of electron beams in a simple way and provide an electron microscope and an electron generation method. <P>SOLUTION: The electron gun 100 in this application is an electron gun discharging electrons in a direction of incident laser beams, and is provided with a laser beam source, a hollow light guide member where the laser beam from the laser beam source enters and the incident light propagates repeating total reflections inside, a hollow lens refracting light emitted from the light guide member, and a photo-cathode where the laser beam refracted by the lens enters. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010015877(A) 申请公布日期 2010.01.21
申请号 JP20080175843 申请日期 2008.07.04
申请人 JAPAN SYNCHROTRON RADIATION RESEARCH INST 发明人 TOMIZAWA HIROMITSU
分类号 H01J37/073;H01J37/26 主分类号 H01J37/073
代理机构 代理人
主权项
地址