发明名称 Formation of Through-Wafer Electrical Interconnections and Other Structures Using a Thin Dielectric Membrane
摘要 Providing through-wafer interconnections in a semiconductor wafer includes forming a sacrificial membrane in a preexisting semiconductor wafer, depositing metallization over one side of the wafer so as to cover exposed portions of the sacrificial membrane facing the one side of the wafer, removing exposed portions of the sacrificial membrane facing the other side of the wafer, and depositing metallization over the other side of the wafer so as to contact the previously deposited metallization. Techniques also are disclosed for providing capacitive and other structures using thin metal membranes.
申请公布号 US2010015734(A1) 申请公布日期 2010.01.21
申请号 US20090566136 申请日期 2009.09.24
申请人 HYMITE A/S 发明人 SHIV LIOR
分类号 H01L21/66 主分类号 H01L21/66
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