发明名称 X-RAY REFLECTING MIRROR, X-RAY REFLECTING APPARATUS AND X-RAY REFLECTOR USING THE X-RAY REFLECTING MIRROR, AND METHOD FOR PREPARING X-RAY REFLECTING MIRROR
摘要 <p>Disclosed is, for example, an X-ray reflecting mirror that has a reflecting surface having a high smoothness and high and stable imaging (reflective) properties and has a reduced entire mirror weight. An X-ray reflecting mirror with a reflecting surface having a stable curved surface shape can be provided by thermoplastically deforming a silicon substrate.  A silicon wafer can be freely deformed into a desired shape by applying a pressure to the silicon wafer at an elevated temperature of about 1300 degrees in a hydrogen atmosphere.  When the substrate is subjected to hydrogen annealing to further reduce the roughness of the surface of silicon, whereby the reflectance can be improved.</p>
申请公布号 WO2010008086(A1) 申请公布日期 2010.01.21
申请号 WO2009JP63031 申请日期 2009.07.21
申请人 JAPAN AEROSPACE EXPLORATION AGENCY;TOKYO METROPOLITAN UNIVERSITY;MITSUDA KAZUHISA;ISHIDA MANABU;EZOE YUICHIRO;NAKAJIMA KAZUO 发明人 MITSUDA KAZUHISA;ISHIDA MANABU;EZOE YUICHIRO;NAKAJIMA KAZUO
分类号 G21K1/06;G02B5/10 主分类号 G21K1/06
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