发明名称 |
X-RAY REFLECTING MIRROR, X-RAY REFLECTING APPARATUS AND X-RAY REFLECTOR USING THE X-RAY REFLECTING MIRROR, AND METHOD FOR PREPARING X-RAY REFLECTING MIRROR |
摘要 |
<p>Disclosed is, for example, an X-ray reflecting mirror that has a reflecting surface having a high smoothness and high and stable imaging (reflective) properties and has a reduced entire mirror weight. An X-ray reflecting mirror with a reflecting surface having a stable curved surface shape can be provided by thermoplastically deforming a silicon substrate. A silicon wafer can be freely deformed into a desired shape by applying a pressure to the silicon wafer at an elevated temperature of about 1300 degrees in a hydrogen atmosphere. When the substrate is subjected to hydrogen annealing to further reduce the roughness of the surface of silicon, whereby the reflectance can be improved.</p> |
申请公布号 |
WO2010008086(A1) |
申请公布日期 |
2010.01.21 |
申请号 |
WO2009JP63031 |
申请日期 |
2009.07.21 |
申请人 |
JAPAN AEROSPACE EXPLORATION AGENCY;TOKYO METROPOLITAN UNIVERSITY;MITSUDA KAZUHISA;ISHIDA MANABU;EZOE YUICHIRO;NAKAJIMA KAZUO |
发明人 |
MITSUDA KAZUHISA;ISHIDA MANABU;EZOE YUICHIRO;NAKAJIMA KAZUO |
分类号 |
G21K1/06;G02B5/10 |
主分类号 |
G21K1/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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