| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an organic EL element measurement method for executing higher level measurement of an organic EL element. Ž<P>SOLUTION: With an organic EL element emitting light, a light emission measuring means applies light to a sample from the translucent substrate side, to measure the polarized state of the light reflected by the sample. Further, with the EL element prevented from emitting a light, a non-light emission measuring means applies light to the sample from the translucent substrate side, to measure the polarized state of the light reflected by the sample. By fitting using a model, a light emission calculating means calculates an optical constant of a film based on the polarized state of the light measured by the light emission measuring means. Likewise, a non-light emission calculating means calculates the optical constant of the film, based on the polarized state of the light measured by the non-light emission measuring means. Finally, an output means outputs the difference or the ratio between the optical constants calculated by the light emission calculating means and by the non-light emission calculating means, respectively. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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