发明名称 |
INTEGRATED TESTING CIRCUITRY FOR HIGH-FREQUENCY RECEIVER INTEGRATED CIRCUITS |
摘要 |
<p>An integrated circuit (10) comprises a receiver (12) and an oscillator circuit (36, 42). The receiver has a first input port (HF port) (14) for receiving a first oscillatory input signal, a second input port (LO port) (16) for receiving a second oscillatory input signal, and an output port (18) for delivering an oscillatory output signal (IF signal) which is a function of both the first input signal and the second input signal. The oscillator circuit has a first output port (36) for delivering a first oscillatory signal (HF signal), and a second output port (42) for delivering a second oscillatory signal (LO signal). The first output port (36) of the oscillator circuit is coupled to the HF port (14), and the second output port (42) of the oscillator circuit is coupled to the LO port (16). The integrated circuit may be designed such that the HF port (14) may be disconnected from the first output port (36) of the oscillator circuit without affecting the operability of the receiver (12). An apparatus for testing the proper functioning of an integrated circuit (10) as described above and a method of producing a receiver are also disclosed. The method may facilitate testing a receiver die during production. In particular it may avoid the need for feeding high-frequency signals from an external apparatus to the die.</p> |
申请公布号 |
WO2010007473(A1) |
申请公布日期 |
2010.01.21 |
申请号 |
WO2008IB52877 |
申请日期 |
2008.07.17 |
申请人 |
REUTER, RALF;FREESCALE SEMICONDUCTOR, INC.;DEHLINK, BERNHARD |
发明人 |
DEHLINK, BERNHARD;REUTER, RALF |
分类号 |
G01R31/28;G01R31/00;H04B17/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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