发明名称 WAFER SUPPORT DEVICE AND COMPONENT USED FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To fully cool down a guard ring while preventing lifting and damage of the guard ring. SOLUTION: A wafer support device 20 includes an electrostatic chuck 22 capable of adsorbing a silicon wafer W as an object of plasma processing, a guard ring 30 mounted on a step 26 of the electrostatic chuck 22, a cooling plate 40 placed on a backside of the electrostatic chuck 22 for cooling the electrostatic chuck 22, and a coolant gas flow path 50 arranged to supply a flow of coolant gas for cooling the guard ring 30. The guard ring 30 has a skirt 34 arranged to cover over a side face of the electrostatic chuck 22. The coolant gas flow path 50 is formed to make the coolant gas flow from a backside of the cooling plate 40 through an outer circumferential area 48 of an adhesive sheet 47 to be spread over and collide against a whole circumference on an inner wall of the skirt 34 of the guard ring 30. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010016363(A) 申请公布日期 2010.01.21
申请号 JP20090133959 申请日期 2009.06.03
申请人 NGK INSULATORS LTD 发明人 MOROOKA IKUMA
分类号 H01L21/683;H01L21/205;H01L21/3065 主分类号 H01L21/683
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