发明名称 METAL LINE PATTERN USING A TUNGSTEN REGROWING AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A method for forming a metal wiring pattern by regrowing tungsten is provided to form a device with high integrity by forming a metal wiring structure on a tungsten plug through the regrowth of the tungsten without a photolithography process. CONSTITUTION: A first interlayer insulating film(110) is formed on a semiconductor substrate(100). The first interlayer insulation film is planarized. A contact hole is formed for making a metal wiring layer. A tungsten plug layer(130) is deposited on an upper side of a barrier metal(120). The tungsten plug layer is planarized. The tungsten plug layer is regrown by a plasma oxidation or RTA(Rapid Thermal Annealing) process. A second interlayer insulation film(150) is formed on the first interlayer insulation film and the regrown tungsten layer(140). The second interlayer insulation film is planarized. The regrown tungsten layer is grown based on the tungsten plug layer.
申请公布号 KR20100006646(A) 申请公布日期 2010.01.21
申请号 KR20080066858 申请日期 2008.07.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, SUK HUN;HONG, CHANG KI;SIM, HYUN JUN;SON, YOON HO
分类号 H01L21/28 主分类号 H01L21/28
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