| 摘要 |
<P>PROBLEM TO BE SOLVED: To inclusively evaluate and inspect an appearance abnormal section and a surface depth abnormal section on many conditions that are close for visual inspection, using a simple apparatus structure. Ž<P>SOLUTION: The cylinder peripheral surface inspecting apparatus 10 comprises an illumination section 12 for projecting the striped pattern from the bright field to the dark field on the peripheral surface of the cylinder object 1; a line laser projector for projecting light on the cylinder peripheral surface; a camera 14 for imaging the cylinder peripheral surface; and an image processing apparatus 30 for extracting the abnormal sections of the cylinder object 1 from pick-up image data. The image processing apparatus 30 comprises an appearance abnormality inspection section that aligns the positions of a plurality of developed images of different illumination conditions and imaging angles, reconstructs them into a virtual screen hierarchical array, and extracts the appearance abnormal section of the cylinder object 1 from stratification image data; a surface depth abnormality inspection section that indexes, from image data, the position of the cylinder peripheral surface on which a line laser beam is projected, extracts the surface depth abnormal section, and maps it on the virtual screen hierarchy array while performing alignment; and a determining section for inclusively determining the pass/fail of the cylinder object 1 from many data of different abnormality extraction conditions that are similar to visual inspection. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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