发明名称 INTERCONNECT STRUCTURES FOR INTEGRATION OF MULTI-LAYERED INTEGRATED CIRCUIT DEVICES AND METHODS FOR FORMING THE SAME
摘要 Semiconductor devices comprise at least one integrated circuit layer, at least one conductive trace and an insulative material adjacent at least a portion of the at least one conductive trace. At least one interconnect structure extends through a portion of the at least one conductive trace and a portion of the insulative material, the at least one interconnect structure comprising a transverse cross-sectional dimension through the at least one conductive trace which differs from a transverse cross-sectional dimension through the insulative material. Methods of forming semiconductor devices comprising at least one interconnect structure are also disclosed.
申请公布号 US2010013107(A1) 申请公布日期 2010.01.21
申请号 US20080174393 申请日期 2008.07.16
申请人 MICRON TECHNOLOGY, INC. 发明人 SANDHU GURTEJ S.;SINHA NISHANT;SMYTHE JOHN A.
分类号 H01L23/52;H01L21/4763 主分类号 H01L23/52
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