发明名称 A METHOD AND A DEVICE FOR DETERMINING THE END POINT OF A CLEANING OPERATION OF A CVD APPARATUS
摘要 <p>A method of determining an end point for a remote microwave plasma cleaning system. In one embodiment, the method comprises several steps. The first step is to expose an electrical device to a deposition operation. Next, the electrical device is exposed to a plasma cleaning operation. In the following step, a value for a performance characteristic of the electrical device is measured. In the last step, an amount of cleaning performed on the electrical device is calculated based on a relationship between a baseline value of the performance characteristic and on the measured value of the performance characteristic of the electrical device.</p>
申请公布号 EP1274877(B1) 申请公布日期 2010.01.20
申请号 EP20010924567 申请日期 2001.03.29
申请人 PHILIPS SEMICONDUCTORS INC.;NXP B.V. 发明人 ANNAPRAGADA, RAO, VENKATESWARA
分类号 C23C16/44;B08B5/00;B08B9/00;C23C16/52;H01J37/32;H01L21/205 主分类号 C23C16/44
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