发明名称 |
Charged particle beam extraction system and method |
摘要 |
<p>A charged particle beam extraction system and method capable of ensuring higher safety when extraction of an ion beam is on/off-controlled during irradiation of the ion beam for treatment. The charged particle beam extraction system comprises a charged particle beam generator including a synchrotron, a range modulation wheel (RMW) for forming a Bragg peak width of a charged particle beam extracted from the charged particle beam generator, a gate signal generator for controlling start and stop of extraction of the charged particle beam from the charged particle beam generator in accordance with a rotational angle of the RMW, and an irradiation control/determination section for determining whether the start and stop of extraction of the charged particle beam is controlled at desired timing by the gate signal generator.
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申请公布号 |
EP1732369(A3) |
申请公布日期 |
2010.01.20 |
申请号 |
EP20060007863 |
申请日期 |
2006.04.13 |
申请人 |
HITACHI, LTD. |
发明人 |
NAKAYAMA, TAKAHIDE;NATORI, TAKAYOSHI;YANAGISAWA, MASAKI |
分类号 |
A61N5/10;H05H7/10 |
主分类号 |
A61N5/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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