发明名称 Charged particle beam extraction system and method
摘要 <p>A charged particle beam extraction system and method capable of ensuring higher safety when extraction of an ion beam is on/off-controlled during irradiation of the ion beam for treatment. The charged particle beam extraction system comprises a charged particle beam generator including a synchrotron, a range modulation wheel (RMW) for forming a Bragg peak width of a charged particle beam extracted from the charged particle beam generator, a gate signal generator for controlling start and stop of extraction of the charged particle beam from the charged particle beam generator in accordance with a rotational angle of the RMW, and an irradiation control/determination section for determining whether the start and stop of extraction of the charged particle beam is controlled at desired timing by the gate signal generator. </p>
申请公布号 EP1732369(A3) 申请公布日期 2010.01.20
申请号 EP20060007863 申请日期 2006.04.13
申请人 HITACHI, LTD. 发明人 NAKAYAMA, TAKAHIDE;NATORI, TAKAYOSHI;YANAGISAWA, MASAKI
分类号 A61N5/10;H05H7/10 主分类号 A61N5/10
代理机构 代理人
主权项
地址