发明名称 Oblique Incidence Interferometer
摘要 <p>An oblique incidence interferometer 1 includes a light source 11 for emitting coherent light in an oblique direction to a measurement object W; a light collimating unit 12 for collimating the coherent light from the light source 11; a beam dividing unit 14 for dividing the collimated beam from the light collimating unit 12 into a measurement beam and a reference beam; a beam combining unit 15 for combining the measurement beam reflected by the measurement object W with the reference beam; and an image pickup device 17 for picking up images of interference fringes representing a surface shape of the measurement object, wherein the oblique incidence interferometer 1 includes measurement range expanding means 10 for enlarging a light measurement range on the measurement object W in a lateral direction of the measurement range.</p>
申请公布号 EP2146181(A2) 申请公布日期 2010.01.20
申请号 EP20090165179 申请日期 2009.07.10
申请人 MITUTOYO CORPORATION 发明人 SUZUKI, YOSHIMASA;OOTAO, REIYA
分类号 G01B9/02 主分类号 G01B9/02
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