发明名称 SEMICONDUCTOR DEVICE PERIPHERY, NEUTRALISING EFFECT OF CHARGE ON STABILITY OF RETURN LEAKAGE AND BREAKDOWN VOLTAGE
摘要 FIELD: physics; semiconductors. ^ SUBSTANCE: invention relates to power semiconductor devices, specifically to high-voltage semiconductor devices. The semiconductor device periphery has a peripheral annular P-N junction, coated with a dielectric film and surrounded under the dielectric film by a spiral electroconductive film with Zener diodes, with the ends of the spiral connected to P- and N- regions of the junction on the surface of the semiconductor device. The spiral of the electroconductive film with Zener diodes has distance between turns selected based on a given condition. ^ EFFECT: neutralisation of effect of charge on stability of return leakage and breakdown voltage. ^ 6 cl, 1 dwg
申请公布号 RU2379786(C1) 申请公布日期 2010.01.20
申请号 RU20080135636 申请日期 2008.09.02
申请人 发明人 BUBUKIN BORIS MIKHAJLOVICH;KASTRJULEV ALEKSANDR NIKOLAEVICH;RJAZANTSEV BORIS GEORGIEVICH
分类号 H01L29/866 主分类号 H01L29/866
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