| 摘要 |
A scan flip-flop circuit including a data input, a scan input, a data output, a flip-flop, a multiplexer and a delay element is provided. The multiplexer allows selection of either the scan input or the data input for presentation at the input of the flip-flop. The flip-flop provides an output signal at the output of the scan flip-flop. The delay element is in a signal path between the scan input and the input of the flip-flop, and provides a signal propagation delay between the scan input and the input of the flip-flop. The delay between the scan input and the input of the flip-flop is substantially larger than the signal propagation delay between the data input and the input of the flip-flop. The delay in the scan path reduces the need for external buffers to avoid hold-time violations during scan testing of integrated circuits.
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