发明名称 Method for minimizing sample damage during the ablation of material using a focused ultrashort pulsed laser beam
摘要 In one aspect the invention provides a method for laser induced breakdown of a material with a pulsed laser beam where the material is characterized by a relationship of fluence breakdown threshold (Fth) versus laser beam pulse width (T) that exhibits an abrupt, rapid, and distinct change or at least a clearly detectable and distinct change in slope at a predetermined laser pulse width value. The method comprises generating a beam of laser pulses in which each pulse has a pulse width equal to or less than the predetermined laser pulse width value. The beam is focused above the surface of a material where laser induced breakdown is desired. The region of least confusion (minimum beam waist or average spot size) is above the surface of the material in which laser induced breakdown is desired since the intensity of the beam falls off in the forward direction, preferably the region of the beam at or within the surface is between the region of least confusion and sufficient to remove material and the minimum intensity necessary for laser induced breakdown of the material to be removed, most preferably the region of minimum intensity is disposed at the surface of the material to be removed. The beam may be used in combination with a mask in the beam path. The beam or mask may be moved in the x, y, and Z directions to produce desired features. The technique can produce features smaller than the spot size and Rayleigh range due to enhanced damage threshold accuracy in the short pulse regime.
申请公布号 US7649153(B2) 申请公布日期 2010.01.19
申请号 US20010933461 申请日期 2001.08.20
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HAIGHT RICHARD ALAN;LONGO PETER P.;MORRIS DANIEL PETER;WAGNER ALFRED
分类号 B23K26/36;A61B18/26;B23K26/06;B23K26/40;G03F1/00 主分类号 B23K26/36
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